Veeco Instruments Dimension 3000 AFM

Atomic force microscopy (AFM) employs a probe which moves in close proximity to the surface of a sample. Nanostructures on the surface of the sample are detected, providing the following information:

• three-dimensional surface topography
• surface roughness
• phase images (nano-mechanical property images)

For more detailed information about atomic-force microscopy (also known as “scanning probe microscopy” (SPM)), please see Scanning Probe Microscopy (SPM): Imaging Surfaces on a Fine Scale by John W. Cross.